2005 International Conference on Integrated Circuit Design and Technology
... when translated to 2u2 devices, is 20 parts per trillion (ppT) after 10 years of operation at 85AdC. If we allow plasma charging damage to consume 10% of the lifetime, then the measured failure fraction must below 2 ppT. Thus the 2.5% failureanbsp;...
| Title | : | 2005 International Conference on Integrated Circuit Design and Technology |
| Author | : | Institute of Electrical and Electronics Engineers. Central Texas Section |
| Publisher | : | Institute of Electrical & Electronics Engineers(IEEE) - 2005-01-01 |
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